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Transmission Electron Microscopes

TEM Examples

Transmission electron microscopy (TEM) enables characterization of powders and thin films (which can be prepared in a target preparation from bulk materials) by direct imaging with up to atomic resolution. The image information can be locally correlated with spectroscopic techniques (EELS/EFTEM and EDX) to provide semi-quantitative elemental composition/maps with sub-nanometer resolution. All of these techniques can also be performed in-situ, e.g. during heating, electrical biasing or straining to directly correlate structural changes and materials properties. For complex three-dimensional structures, electron tomography can be used to generate a 3D representation of the material with a spatial resolution of 1–2 nm.

 

1. FEI Titan 80-300 Transmission Electron Microscopy 

FEI Titan 80-300 at KIT CN 
  • FEI Titan 80–300
           -        FEG
           -       
    Aberration corrector
           -        Gatan Ultrascan CCD
           -       
    HAADF-STEM detector
           -       
    Gatan GIF 863
           -       
    EDAX S-UTW EDX detector
  • Resolution:
           -       
    0.08 nm information limit TEM
           -       
    0.14 nm resolution in STEM
           -       
    0.7 eV energy resolution EELS
  • Imaging and Analysis Techniques:
           -       
    BF-TEM, aber. cor. HRTEM
           -       
    HAADF-STEM, HRSTEM
           -       
    EFTEM, EELS, EDX
           -       
    (S)TEM tomography
           -       
    Electron diffraction
           -       
    Lorentz imaging
           -       
    Low-dose techniques & cryo imaging
 

2. FEI Tecnai F20-ST Transmission Electron Microscopy

 Tecnai F20ST
  • FEI Tecnai F20-ST
           -       
    FEG

           -       
    HAADF-STEM detector

           -       
    Gatan GIF2001

           -       
    EDAX S-UTW EDX detector

           -       
    NanoMegas ASTAR System
  • Resolution:
           -       
    0.15 nm information limit TEM
           -       
    0.19 nm resolution in STEM
           -       
    0.7 eV energy resolution EELS
  • Imaging and Analysis Techniques:
           -       
    BF-TEM, HRTEM
           -       
    HAADF-STEM, HRSTEM
           -       
    EFTEM, EELS, EDX
           -       
    (S)TEM tomography
           -       
    Electron diffraction, electron precession
           -       
    Orientation mapping
 

3. Holders available for the Titan 80-300 and the Tecnai F20-ST

TEM holders 
  • Analytical single-tilt holder
  • Analytical double-tilt holder
  • Tomography holder - Fischione 2020 Advanced tomography holder
  • Heating holder - Protochips Aduro: RT-1200ºC
  • Double-tilt heating holder- Gatan 652: RT-800ºC
  • Cooling holder - Gatan 915: LN2-80ºC
  • Straining holder - Hysitron Picoindenter PI 95
  • Heating straining holder - Gatan 654
  • Electrical Biasing - Protochips Aduro
  • Electro chemistry - Protochips Poseidon 500