Themis 300
Configuration
-
High Tension: 80, 200, 300 kV
-
X-FEG
-
Aberration corrected (STEM)
-
BF-/seg. DF-/HAADF-STEM detector
-
Super-X EDX detector
-
Dectris pixelated detector
-
NanoMegas ASTAR system
Resolution
| 300 kV | 200 kV | 80 kV | |
| Point Resolution TEM [nm] | 0.2 | 0.24 | |
| Information Limit TEM [nm] | 0.1 | 0.1 | |
| Resolution STEM [nm] | 0.08 | 0.1 | 0.14 |
Imaging and Analysis Techniques
-
BF-TEM & HRTEM
-
BF-/DF-/HAADF-STEM
-
4D-STEM: DPC/iDPC/PDF & ACOM
-
EDX Analysis
-
(S)TEM & EDX tomography
-
Electron diffraction
-
Lorentz imaging
-
Low-dose techniques & cryo imaging