Advanced Scanning Probe Microscopy Techniques Organizers: Hendrik Hölscher (Institute of Microstructure Technology, KIT) Thomas Schimmel (Institute of Nanotechnology, KIT) Invited Speakers: Kirsten von Bergmann (Universität Hamburg) Stefan Heinze (Carl-Albrechts-Universität zu Kiel) Diethelm Johannsmann (TU-Clausthal) Hideki Kawakatsu (The University of Tokyo) Fabian Pauly (Universität Konstanz) Heike Riel (IBM Research Zürich) Sascha Sadewasser (International Iberan Nanotechnology Laboratory) Registration: Please register by sending the registration form to Hendrik Hölscher. The number of attendees is limited. The registration fee for the workshop is 100 €. A reduced fee for students is available at 50 €. Deadline for registration is February 14, 2014.

Homepage
https://www.imt.kit.edu/asxmt2014.php

Organizer
PD Dr. Hendrik Hölscher
Institute of Microstructure Technology
Karlsruhe Institute of Nanotechnology
Hermann-von-Helmholtz-Platz 1
76344 Eggenstein-Leopoldshafen
Tel: +49 721 608-22779
Fax: +49 721 608-24331
Mail: hendrik hoelscher ∂does-not-exist.kit edu
https://www.imt.kit.edu/english/388_433.php

Targetgroup
Research and Partners, pupils, Students, Scientific Staff