Transmission electron microscopy (TEM) enables characterization of powders and thin films (which can be prepared in a target preparation from bulk materials) by direct imaging with up to atomic resolution. The image information can be locally correlated with spectroscopic techniques (EELS/EFTEM and EDX) to provide semi-quantitative elemental composition/maps with atomic resolution. All of these techniques can also be performed in-situ, e.g. during heating, electrical biasing or straining to directly correlate structural changes and materials properties. For complex three-dimensional structures, electron tomography can be used to generate a 3D representation of the material with a spatial resolution of ~1 nm.
1. ThermoFisher Themis-Z Transmission Electron Microscopy
 |
- Themis-Z
- High Tension: 60, 80, 300 kV
- X-FEG
- Monochromator
- Double aberration corrected (TEM and STEM)
- Super-X EDX detector
- BF/seg. DF/HAADF-STEM detector
- STEM DPC and iDPC
- Gatan Oneview IS camera
- Gatan GIF Continuum 970 + K3 IS camera
- Resolution 300 kV
- 0.06 nm information limit TEM
- 0.063 nm resolution in STEM
- 0.15 eV energy resolution EELS
- Resolution 80 kV
- 0.09 nm information limit TEM
- 0.08 nm resolution in STEM
- 0.15 eV energy resolution EELS
- Resolution 60 kV
- 0.1 nm information limit TEM
- 0.1 nm resolution in STEM
- 0.15 eV energy resolution EELS
- Imaging and Analysis Techniques:
- BF-TEM & HRTEM
- BF-/DF-/HAADF-STEM
- 4D-STEM: DPC/iDPC/PDF
- EFTEM, EELS, EDX Analysis
- (S)TEM-EDX tomography
- Electron diffraction
- Lorentz imaging
- Low-dose techniques & cryo imaging
- AXON & Clarity in-situ integration
|
2. ThermoFisher Themis-Z Transmission Electron Microscopy
| |
- Themis 300
- High Tension: 80, 200, 300 kV
- X-FEG
- Aberration corrected (STEM)
- Super-X EDX detector
- BF/seg. DF/HAADF-STEM detector
- STEM DPC and iDPC
- Ceta camera
- NanoMegas ASTAR System
- Pixelated detector to be specified
- Resolution 300 kV
- 0.2 nm point resolution TEM
- 0.08 nm resolution in STEM
- Imaging and Analysis Techniques:
- BF-TEM & HRTEM
- BF-/DF-/HAADF-STEM
- 4D-STEM: DPC/iDPC/PDF/ACOM
- EDX Analysis
- (S)TEM-EDX tomography
- Electron diffraction
- Low-dose techniques & cryo imaging
- Clarity in-situ integration
|
3. ThermoFisher Tecnai F20-ST Transmission Electron Microscopy
 |
- Tecnai F20-ST
- FEG
- HAADF-STEM detector
- Gatan GIF2001
- EDAX S-UTW EDX detector
- Resolution:
- 0.15 nm information limit TEM
- 0.19 nm resolution in STEM
- 0.7 eV energy resolution EELS
- Imaging and Analysis Techniques:
- BF-TEM, HRTEM
- HAADF-STEM, HRSTEM
- EFTEM, EELS, EDX
- (S)TEM tomography
- Electron diffraction, electron precession
- Orientation mapping
|
4. Holders available for the ThermoFisher TEMs
 |
- Analytical single-tilt holder
- Analytical double-tilt holder
- Tomography holder - Fischione 2020
- Analytical tomorgaphy holder - Fischione 2021
- On-axis rotation tomography holder - Fischione 2050
- Heating/biasing holder - Protochips Aduro: RT-1200ºC
- Double-tilt heating/biasing holder - Protochips Fusion: RT-1200ºC
- Double-tilt heating holder- Gatan 652: RT-800ºC
- Cooling holder - Gatan 915: LN2-80ºC
- Straining holder - Hysitron Picoindenter PI 95
- Heating straining holder - Gatan 654
- Electro chemistry - Protochips Poseidon 510
- Gas holder - Protochips Atmosphere with RGA analysis
- Protochips AXON and Clarity software integration
|
