SEM/TEM Sample Preparation

A collection of the main tools for coating, grinding and polishing available with the electron microscopy & spectroscopy group for SEM and TEM sample preparation. In addition, a number of optical microscopes are available and a glovebox for handling of samples under an inert atmosphere.

1. Fischione 1040 NanoMill Low-voltage argon ion polishing system for site selective thinning of TEM sample	2. JEOL Cross Section Polisher II Large area argon ion beam cross-section and plane view preparation.	3. Precission Ion Polishing System Gatan 691 PIPS with additional low-voltage argon ion polishing system and optional cryo cooling Gatan 691 PIPS with additional low-voltage argon ion polishing system
4. Electro Polishing Struers TenuPol-5 electropolishing system	5. Bulk Preparation Sommer GS-1000 wire saw Gatan 656 dimple grinder Gatan 623 disc grinder Tegramin polisher Struers RotoPol-25 polisher Struers LaboPress-1 infiltration system	6. Leica EM UC7 Ultramicrotome Preparation of ultrathin slices of polymers and composites using various diamond knifes.
7. Fischione 1020 Plasma Cleaner Ar and Ar/O2 plasma cleaner for removal of organic contaminant	8. Optical Microscopes 2x Leica AxioTech Stereomicroscope Leica S6E Stereomicroscope Leica M80 Microscope	9. Sputter Coater Cressington 328 high-vacuum carbon/metal coater Cressington 108 carbon coater Cressington 108 gold coater
10. Glovebox with Braun MB10 glove box Laminar Flow Box	micromanupulator SmarAct micromanipulator for remote sample loading

1. Fischione 1040 NanoMill

NanoMill

Low-voltage argon ion polishing system for site selective thinning of TEM sample

2. JEOL Cross Section Polisher II

JEOL Cross Section Polisher II

Large area argon ion beam cross-section and plane view preparation.

3. Precission Ion Polishing System

Gatan PIPS

Gatan 691 PIPS with additional low-voltage argon ion polishing system and optional cryo cooling
Gatan 691 PIPS with additional low-voltage argon ion polishing system