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Publications

2015

2014

2013

  • H. Gleiter, H. Hahn, Th. Schimmel:
    Advances in nanomaterials, Beilstein Journal of Nanotechnology 4, 805-806 (2013).
  • R. Eisele, N. J. Blumenstein, J. Baier, S. Walheim, Th. Schimmel, J. Bill:
    Synthesis and characterization of textured Al-doped zinc oxide films prepared by template-directed deposition, CrystEngComm, (2013) doi: 10.1039/C3CE41701H.
  • C. Wege, F. J. Eber, C. Azucena, S. Degenhard, F. Geiger, A. M. Bittner, S. Walheim, A. Förste, C. Huang, Th. Schimmel, H. Jeske, H. Gliemann:
    “Functionality-on-a-stick”: complex self-assembling virus derivatives – fabrication, activation and integration into technical environments, In: Th. Schimmel, H. v. Löhneysen, M. Barczewski, editors. Advances in Nanotechnology – Physics, Chemistry, and Biology of Functional Nanostructures. Stuttgart: Baden-Wuerttemberg Stiftung GmbH, 97-125 (2013).
  • D. Martini, O. Marti, M. Beil, T. Paust, C. Huang, M. Moosmann, J. Jin, T. Heiler, R. Gröger, Th. Schimmel, S. Walheim:
    Interaction of Epithelial Cells with Surfaces and Surfaces Decorated by Molecules, In: Th. Schimmel, H. v. Löhneysen, M. Barczewski, editors. Advances in Nanotechnology – Physics, Chemistry, and Biology of Functional Nanostructures. Stuttgart: Baden-Wuerttemberg Stiftung GmbH, 151-190 (2013).
  • X. Lin, A. Dasgupta, F.-Q. Xie, A. Groß, F. Evers, Th. Schimmel:
    Elucidating microscopic processes in electrochemically controlled Pb atomic-scale switches, In: Th. Schimmel, H. v. Löhneysen, M. Barczewski, editors. Advances in Nanotechnology – Physics, Chemistry, and Biology of Functional Nanostructures. Stuttgart: Baden-Wuerttemberg Stiftung GmbH, 197-219 (2013).
  • B. Kopp, D. Benner, Z. Yi, J. Boneberg, F.-Q. Xie, C. Obermair, P. Leiderer, E. Scheer, Th. Schimmel:
    Light-induced Effects in the Electronic Transport through Atomic Metal Point Contacts, In: Th. Schimmel, H. v. Löhneysen, M. Barczewski, editors. Advances in Nanotechnology – Physics, Chemistry, and Biology of Functional Nanostructures. Stuttgart: Baden-Wuerttemberg Stiftung GmbH, 257-273 (2013).
  • E. Redel, Z. Wang, S. Walheim, J. Liu, H. Gliemann, C. Wöll:
    On the dielectric and optical properties of surface-anchored metal-organic frameworks: a first study on epitaxially grown SURMOF thin films, Appl. Phys. Lett 103, 091903 (2013)

2012

2011

2010

2009

  • S. Zhong, Th. Koch, M. Wang, T. Scherer, S. Walheim, H. Hahn, Th. Schimmel:
    Nanoscale Twinned Copper Nanowire Formation by Direct Electrodeposition.
    Small 5 (20), 2265–2270 (2009).
  • C. Obermair, F.-Q. Xie, R. Maul, W. Wenzel, G. Schön, Th. Schimmel,
    Single-atom transistors: switching an electrical current with individual atoms.
    invited paper,
    In: H. Hahn, A. Sidorenko, I. Tiginyanu (Eds.) Nanoscale Phenomena – Fundamentals and Applications, Springer Serie: NanoScience and Technology, Heidelberg, Dordrecht, London, New York, 2009, pp.113–124.
  • B. Schmidt-Hansberg, M. F. G. Klein, K. Peters, F. Buss, J. Pfeifer, S. Walheim, A. Colsmann, U. Lemmer, P. Scharfer, W. Schabel:
    In situ monitoring the drying kinetics of knife coated polymer-fullerene films for organic solar cells.
    Journal of Applied Physics 106 (12) (2009)
  • N. Mechau, R. Groeger, A. Prodi-Schwab, R. Schmechel:
    Reduced conductivity in poly(3,4-ethylenedioxythiophen)-poly(styrene sulfonate) and indium tin oxide nanocomposite for low indium tin oxide content.
    Journal of Applied Physics 105 (5) (2009).
  • L. V. Kukharenko, Th. Schimmel, H. Fuchs, L. G. Gelis, I. V. Lazareva:
    Scanning Force Microscopy Study of Activated Human Platelets Interaction with Leucocytes and Red Blood Cells.
    Physics, Chemistry and Application of Nanostructures 523–526 (2009).
  • L. V. Kukharenko, Th. Schimmel, S. Walheim, T. Koshikawa, N. G. Tsirkunova, O. V. Aleinikova, T. V. Shman:
    K562 Cells Study with Scanning Force and Confocal Laser Scanning Microscopy.
    Physics, Chemistry and Application of Nanostructures 527–530 (2009).
  • C. Obermair, F.-Q. Xie, Th. Schimmel:
    The Single-Atom Transistor: Quantum Electronics at Room Temperature.
    IEEE NANO 2009 Proceedings and also in IEEE Xplore database, (2009).
  • B. Ketterer, H. Vasilchina, S. Ulrich, M. Stueber, H. Leiste, C. Adelhelm, T. Kaiser, Th. Schimmel:
    Magnetron Sputtered Thin Film Cathode Materials for Lithium-Ton Batteries in the System Li-Co-O.
    In NATO Science for Peace and Security Series B: Physics and Biophysics; Reithmaier, J. P., Petkov, P., Kulisch, W., Popov, C., Eds.; Springer: 405–409 (2009).
  • D. Grabco, O. Shikimaka, E. Harea, N. Gehm, Th. Schimmel, T. Koch:
    Anomalous dissolution of microindentation deformed zone of ITO/Si coated system.
    Physica Status Solidi C – Current Topics in Solid State Physics, Vol 6, No 5, 6 (5), 1295–1298 (2009).

2008

  • F.-Q. Xie, R. Maul, A. Augenstein, C. Obermair, E.B. Starikov, G. Schön, Th. Schimmel, W. Wenzel,
    Independently switchable atomic quantum transistors by reversible contact reconstruction.
    Nano Lett. 8 (9), 2944–2948 (2008).
  • F. Xie, R. Maul, C. Obermair, E.B. Starikov, W. Wenzel, G. Schön, Th. Schimmel:
    Pre-selectable integer quantum conductance of electrochemically fabricated silver point contacts.
    Applied Physics Letters 93 (4), 3103 (2008).
  • T. Geldhauser, P. Leiderer, J. Boneberg, S. Walheim, Th. Schimmel:
    Generation of Surface Energy Patterns by Pulsed Laser Interference Lithography
    on Self-Assembled Monolayers.
    Langmuir 24 (22), 13155–13160 (2008).
  • N. Deyneka-Dupriez, U. Herr, H.-J. Fecht, A. Pfrang, Th. Schimmel, B. Reznik, D. Gerthsen:
    Interfacial adhesion and friction of pyrolytic carbon thin films on silicon substrates.
    Journal of Materials Research 23 (10), 2749-2756 (2008).
  • S. Kalinina, H. Gliemann; M. Lopez, A. Petershans, J. Auernheimer, M. Bruns, Th. Schimmel,
    H. Kessler, A. Schambony, D. Wedlich:
    Isothiocyanate-functionalized RGD-peptides for tailoring cell-adhesive surface patterns.
    Biomaterials 29, 3004–3013 (2008).
  • S. Anteboth, A. Brückner-Foit, M.J. Hoffmann, U. Sutter, Th. Schimmel, M. Müller:
    Electromechanical behaviour of PZT with real domain structure.
    Computational Materials Science 41, 420–429( 2008).
  • A. Pfrang, M. Müller, Th. Schimmel,
    Chemical Contrast Imaging.
    Photonik, 02/08 (2008).
  • M. Smetanin, R.N. Viswanath, D. Kramer, D. Beckmann, Th. Koch,
    L.A. Kibler, D.M. Kolb, J. Weissmüller:
    Surface stress-charge response of a (111)-textured gold electrode
    under conditions of weak ion adsorption.
    Langmuir 24 (16), 8561–8567 (2008).
  • S. Zhong, Th. Koch, S. Walheim, E. Nold, T. Scherer, H. Hahn, M. Wang, Th. Schimmel,
    Nanodraht-Arrays aus Kupfer durch selbstorganisierte galvanische Abscheidung.
    Photonik (Nanotechnik) 01/08 (2008)

2007

  • F. Hennrich, R. Krupke, K. Arnold, J.A.R. Stütz, S. Lebedkin, Th. Koch, Th. Schimmel, M. Kappes: The mechanism of cavitation-induced scission of single-walled carbon nanotubes.
    Journal of Physical Chemistry B 111 (2007).
  • H. Gliemann, A.T. Almeida, D.F.S. Petri, Th. Schimmel:
    Nanostructure formation in polymer thin films influenced by humidity.
    Surf. Interface Anal. 39, 1–8 (2007).
  • B.J. Mullins, A. Pfrang, R.D. Braddock, Th. Schimmel, G. Kaspers:
    Detachment of liquid droplets from fibres – experimental and theoretical evaluation
    of detachment force due to interfacial tension effects.

    Journal of Colloid and Interface Science 312, 333–340(2007).
  • V. Zdravkov, A. Sidorenko, A. Rossolenko, V. Ryazanov, I. Bdikin, O. Krömer,
    E. Nold, Th. Koch, Th. Schimmel:
    Reliable preparation of high-quality superconducting thin films for application.
    Journal of Physics 61, 606–611 (2007).
  • A. Pfrang, K. Schladitz, A. Wiegmann, Th. Schimmel:
    Calculation of the Evolution of Surface Area and Free Volume During the Infiltration of Fiber Felts.
    Chem. Vap. Deposition 13, 705–715 (2007).

2006

  • F.-Q. Xie, C. Obermair and Th. Schimmel:
    Configuring a Bistable Atomic Switch  by Repeated Electrochemical Cycling.
    Invited articlein: R. Gross et al. (eds.), Nanoscale Devices – Fundamentals and Applications. Springer, 153–162, 2006.
  • A, Sidorenko, V. Zdravkov, V. Ryazanov, S. Horn, S. Klimm, R. Tidecks, A. Wixforth,
    Th. Koch, Th. Schimmel:
    Thermally activated Flux Flow in MgB2: Strong Magnetic Field Dependence
    of the Activation Energy.
    Invited articlein, R. Gross et al. (eds.), Nanoscale Devices – Fundamentals and Applications. Springer, 142, (2006).
  • S.M. Pancera, H. Gliemann, Th. Schimmel, D.F.S. Petri:
    Effect of pH on the adsorption and activity of creatine phosphokinase.
    J. Phys. Chem. B 110, 2674–2680 (2006).
  • S.M. Pancera, H. Gliemann, Th. Schimmel, D.F.S. Petri:
    Adsorption behaviour and activity of hexokinase.
    J. Coll. Interface Sci. 302, 417–423 (2006).
  • Th. Schimmel, F.-Q. Xie and C. Obermair:
    Quantenelektronik: Weltweit erster atomarer Transistor
    Elektronik 55 (20), 14–17 (2006)
  • H. Gliemann, Y. Mei, M. Ballauff, Th. Schimmel:
    Adhesion of spherical polyelectrolyte brushes on mica: an in situ AFM investigation.
    Langmuir 22, 7254–7259 (2006).
  • J. López Gejo, N. Manoj, S. Sumalekshmy, H. Gliemann, Th. Schimmel, M. Wörner, A.M. Braun;
    Vacuum-ultraviolet photochemically initiated modification of polystyrene surfaces: morphological changes and mechanistic investigations.
    Photochem. Photobiol. Sci. 5, 948–954 (2006).
  • V. De Pauw, A. Collin, W. Send, J. Hawecker, D. Gerthsen, A. Pfrang, Th. Schimmel:
    Development of texture and deposition rates during the early stages of pyrolytic carbon deposition in a hot-wall reactor.
    Carbon 44, 3091–3101 (2006).
  • M. Müller, Th. Schimmel, P. Häußler, H. Fettig, O. Müller, A. Albers:
    Finite Element Analysis of V-shaped Cantilevers for Atomic Force Microscopy under Normal and Lateral Force Loads.
    Surf. Interface Anal. 38, 1090–1095 (2006).
  • Ch. Poulton, Ch. Koos, M. Fujii, A. Pfrang, Th. Schimmel, J. Leuthold, W. Freude:
    Radiation modes and roughness loss in high index-contrast waveguides.
    IEEE Journ. Of selected topics in Quantum Electronics 12(6), 2006
  • F. Xie, C. Obermair, Th. Schimmel:
    Elektrische Ströme schalten mit einzelnen Atomen.
    Physik i. u. Z. 6, 159–160 (2006).
  • A. Gigler, C. Gnahm, O. Marti, Th. Schimmel, S. Walheim:
    Towards quantitative materials characterization with Digital Pulsed Force Mode imaging
    Journal of Physics: Conference Series (2006)

2005

  • A. Pfrang, B. Reznik, Th. Schimmel, D. Gerthsen:
    Microstructure Analysis of a Carbon-Carbon Composite Using Argon Ion Etching.
    Microscopy and Microanalysis 11, 46–55 (2005).
  • J. Lopéz-Gejo, H. Gliemann, Th. Schimmel, A. M. Braun:
    Vacuum-Ultraviolet Photochemically Initiated Modification of Polystyrene Surfaces
    Photochemistry and Photobiology 81 (4), 777–782 (2005).
  • T.S. Balaban, M. Linke-Schaetzel, A.D. Bhise, N. Vanthuyne, Ch. Roussel, C.E. Anson, G. Buth, A. Eichhöfer, K. Foster, G. Garab, H. Gliemann, R. Goddard, T. Javorfi, A.K. Powell, H. Rösner, Th. Schimmel:
    Structural Characterization of Artificial Self-assembling Porphyrins that Mimic the Natural Chlorosomal Bacteriochlorophylls c, d and e.
    Chem. Eur. J. 11, 2267–2275 (2005).
  • H. Gliemann, Th. Koch, M. Ballauff, Th. Schimmel:
    Große Kräfte für kleine Partikel: Die Counterion Release Force als treibende Kraft für die Beschichtung.
    Photonik 2, 81–82 (2005).
  • A.T. Almeida, H. Glieman, D.F.S. Petri, Th. Schimmel:
    Characterization of PMMA/PVB Blend Films by Atomic Force Microscopy.
    Microscopy and Microanalysis 11, 122–125 (2005).
  • S.M. Pancera, H. Gliemann, D.F.S. Petri, Th. Schimmel:
    Adsorption Behaviour of Creatin Phosphokinase onto Silicon Wafers: Comparison Between Ellipsometric and Atomic Force Microscopy Investigation
    Microscopy and Microanalysis 11, 56–59 (2005).
  • A. Sidorenko, V. Zdravkov, V. Ryazanov, S. Horn, S. Klimm, R. Tidecks, A. Wixforth, Th. Koch, Th. Schimmel:
    Thermally Assisted Flux Flow In MgB2 : Strong Magnetic Field Dependence of the Activation Energy.
    Phil. Mag. 85, No 16, p.1783 (Juni 2005).
  • Th. Schimmel, F.-Q. Xie, C. Obermair:
    Atomare Elektronik: Mit einzelnen Atomen elektrische Ströme schalten.
    Spezial Nanotechnik in: Photonik 6, Dezember 2005.

2004

  • F.Q. Xie, L. Nittler, C. Obermair, and Th. Schimmel:
    Gate-controlled atomic quantum switch,
    Physical Review Letters 93, (12) 2004)
  • M. Müller, Th. Fiedler, R. Gröger, Th. Koch, S. Walheim, C. Obermair, and Th. Schimmel:
    Controlled Structuring of Mica Surfaces with the Tip of an AFM by Mechanically Induced Local Etching,
    Surface and Interface Analysis 36, 189–192 (2004)
  • C. Obermair, R. Kniese, F.-Q. Xie, and Th. Schimmel:
    Quantized Conductance in Atomic-Scale Point Contacts Formed by Local Electrochemical Deposition of Silver,
    Invited Paper In: Molecular Nanowires and other Quantum Objects, Eds. A.S. Alexandrov, J. Demsar, and I.K. Yanson, NATO Science Series: II, Mathematics, Physics and Chemistry (Kluwer Academic Press, Dordrecht 2004) 233–242
  • M. Linke-Schaetzel, A. D. Bhise, H. Gliemann, Th. Koch, Th. Schimmel, and T. S. Balaban:
    Self-Assembled Chromophores for Hybrid Solar Cells,
    Thin Solid Films 451–452, 16–21 (2004)
  • P. von Blanckenhagen, M. Chao, R. Gröger, Th. Koch, and Th. Schimmel:
    Magnetic Clusters and Cluster Agglomeration Analysed by Scanning Force Microscopy,
    Surface and Interface Analysis 36, 161–165 (2004)
  • A. Pfrang, Th. Schimmel:
    Quantitative Analysis of Pyrolytic Carbon Films by Polarized Light Microscopy,
    Surface and Interface Analysis 36, 184–188 (2004)
  • A. Pfrang, B. Reznik, Th. Schimmel, D. Gerthsen:
    Microstructure Analysis of a Carbon-Carbon Composite Using Argon Ion Etching,
    Proc. Carbon 2004, Providence, USA (2004).
  • A. Pfrang, Th. Schimmel:
    Quantitative Analysis of Pyrolytic Carbon by Polarized Light Microscopy,
    Proc. Carbon 2004, Providence, USA (2004).
  • A. Pfrang, Y.Z. Wan, V. De Pauw, W. Send, D. Gerthsen, Th. Schimmel:
    Early Stages of the Chemical Vapor Deposition of Pyrolytic Carbon Investigated by Atomic Force Microscopy,
    Proc. Carbon 2004, Providence, USA (2004).
  • A. Pfrang, Th. Schimmel:
    Intermediate Phases of Pyrolytic Carbon Observed by Atomic Force Microscopy,
    Proc. Carbon 2004, Providence, USA (2004).
  • V. De Pauw, A. Collin, W. Send, D. Gerthsen, A. Pfrang, Th. Schimmel:
    Microscopic Investigations of Pyrolytic Carbon Islands Deposited on Silicon Substrates,
    Proceedings Carbon 2004, Providence, USA (2004).
  • A.Sidorenko, V. Zdravkov, S. Horn, R. Tidecks, A. Wixforth, Th. Koch, Th. Schimmel:
    Thermally Activated Flux Flow in Superconducting MgB2 Films.
    Invited Article,  “NANORES-2004”, Kazan 2004, p.14–p18
  • F.-Q. Xie, C. Obermair, and Th. Schimmel:
    Switching an Electrical Current with Atoms: the Reproducible Operation of a Multi-Atom Relay,
    Solid State Communications 132, 437–442 (2004).

2003

  • A .Pfrang, B. Reznik, Th. Schimmel, D. Gerthsen:
    Comparative Study of Differently Textured Pyrolytic Carbon Layers by Atomic Force, Transmission Electron and Polarized Light Microscopy.
    Carbon 41, 181–185 (2003)
  • Y. Mei, A. Wittemann, G. Sharma, M. Ballauff, Th. Koch, H. Gliemann, J. Horbach and
    Th. Schimmel:
    Engineering the Interaction of Latex Spheres with Charged Surfaces: AFM Investigations of Spherical Polyelectrolyte Brushes on Mica.
    Macromolecules 36, 3452–3456 (2003)
  • E.G. Bortchagovsky, B. Reznik, D. Gerthsen, A. Pfrang, Th. Schimmel;
    Optical Properties of Pyrolytic Carbon Deposits Deduced from Measurements of the Extinction Angle by Polarized Light Microscopy
    Carbon 41,  2430–2433 (2003)
  • V. De Pauw, A. Collin, W. Send, D. Gerthsen, A. Pfrang, Th. Schimmel:
    Early Stages of Pyrolytic Carbon Deposition on Planar Substrates in a Hot-Wall Reactor.
    Carbon 2003, Oviedo, Spanien (2003), ISBN 84-607-8305-7, B15
  • A.T. Almeida, H. Gliemann, Th. Schimmel, D.F.S. Petri:
    Adsorption Kinetic of Enolase on Silicon Studied ny In-Situ Ellipsometry and Wet AFM
    Acta Microscopica, Suppl. A, 12, 41–44 (2003)

2002

  • A. Pfrang, K.J. Hüttinger und Th. Schimmel:
    Adhesion Imaging of Carbon Fibre Reinforced Materials in the Pulsed Force Mode of the AFM.
    Surface and Interface Analysis 33, 96–99 (2002)
  • U. Neuberth, L. Walter, G. von Freymann, Th. Schimmel, M. Wegener, G. Khitrova, H.M. Gibbs:
    Spatial Autocorrelation Analysis of Nano-Photoluminescence Images of Single GaAs Quantum Wells.
    Appl. Phys. Lett. 81, 1881–1883 (2002)
  • Th. Schimmel:
    Nanotechnologie –  Vorstoß in atomare Dimensionen.
    Erdöl, Erdgas, Kohle 12, 542–546 (2002); eingeladener Artikel
  • A. Pfrang, B. Reznik, D. Gerthsen, Th. Schimmel:
    A Comparative Study of Pyrocarbon Microstructure by Atomic Force, Transmission Electron and Polarized Light Microscopy
    Proc. Carbon 02, 26th Conference on Carbon, 2002, H052.
  • A. Pfrang, I. Yalman, H. Gliemann, K.J. Hüttinger, Th. Schimmel:
    Investigation of Chemical Vapor Infiltrated Carbon Fiber Felts by Combined Scanning Force Techniques.
    Proc. Carbon 02, 26th Conference on Carbon, 2002, H048.
  • S. M. Pancera, E. B. Alvarez, M. J. Politi, H. Gliemann, Th. Schimmel, D. F. S. Petri:
    Adsorption Behaviour of Creatine Phosphokinase onto Solid Substrates.
    Langmuir 18, 3517–3523 (2002).

2001

  • R. Kemnitzer, Th. Koch, J. Küppers, M. Lux-Steiner, and Th. Schimmel:
    Atomic-Scale Processes of Tribomechanical Etching Studied by Atomic Force Microscopy on the Layered Material NbSe2.
    Invited Paper, In Fundamentals of Tribology and Bridging the Gap between Macro- and Micro/Nanoscale Tribology, Ed. B. Bhushan, NATO-ASI Series (Kluwer, Dordrecht 2001) 495–502
  • M. Müller, Th. Fiedler und Th. Schimmel:
    Nanostructuring of Calcite Surfaces by Tribomechanical Etching with the Tip of an Atomic Force Microscope.
    Invited Paper, In Fundamentals of Tribology and Bridging the Gap between Macro- and Micro/Nanoscale Tribology , Ed. B. Bhushan, NATO-ASI Series (Kluwer, Dordrecht 2001) 487–494.
  • Th. Schimmel and W.J. Lorenz:
    Nanostructuring of Polycrystalline and Single Crystalline Gold Electrodes by Copper Electrodeposition using In Situ Scanning Probe Methods.
    In: Scanning Probe Techniques for Materials: Characterization at Nanometer Scale, Eds. D.C. Hansen, H.S. Isaacs, and K. Sieradzki, PV 2000-35, The Electrochemical Society Series, (Pennington, NJ 2001) 25.
  • C. Obermair, M. Müller, Ch. Klinke, and Th. Schimmel:
    Local Electrical Deposition of Metal Islands Mechanically Induced with the Tip of an Atomic Force Microscope.
    Invited Paper, Acta Physica Sinica (Intl. Ed.) 10, S151–06 (2001).
  • A. Berlinger, H. Gliemann, M. Barczewski, P.E.R. Durigon, D.F. Siqueira Petri, and Th. Schimmel:
    Influence of Sulphonating on Polymer and Polymer Blend Surfaces Studied by Atomic Force Microscopy.
    Surface and Interface Analysis 32, 144–147 (2001).
  • G. von Freymann, E. Kurtz, C. Klingshirn, D. Litvinov, D. Gerthsen, Th. Schimmel und M. Wegener:
    Autocorrelation Spectroscopy on Single Ultrathin Layers of CdSe/ZnSe: Hints for a Non-Thermal Distribution of Excitons in Quantum Islands.
    Proceedings of the 6th International Conference on Near-Field Optics and Related Techniques NFO-6, The Netherlands (August 2000), Journal of Microscopy 202, 218–222 (2001).
  • P.E.R. Durigon, D.F. Siqueira Petri, H. Drings, Th. Schimmel, and M. Bruns:
    Characterization and Modification of Polymer Blends.
    Colloids and Polymer Science 279, 1013–1019 (2001).

2000

  • D. Lüerßen, R. Bleher, H. Richter, Th. Schimmel, H. Kalt, A. Rosenauer, D. Litvinov, A. Kamilli, D. Gerthsen, K. Ohkawa, B. Jobst und D. Hommel:
    Localization of Excitons in Pairs of Natural Dots Induced by Stacking Faults in ZnSe Quantum Wells.
    phys. stat. sol. (a) 178, 189–192 (2000).
  • G. von Freymann, D. Lüerßen, C. Rabenstein, M. Mikolaiczyk, H. Richter, H. Kalt, Th. Schimmel, M. Wegener, K. Okhawa und D. Hommel:
    Near-Field Photoluminescence Imaging of Single Defects in a ZnSe Quantum Well Structure at Low Temperatures.
    Appl. Phys. Lett. 76, 203–205 (2000).
  • D. Lüerßen, R. Bleher, H. Kalt, H. Richter, Th. Schimmel, A. Rosenauer, D. Litvinov, A. Kamilli, D. Gerthsen, B. Jobst, K. Ohkawa und D. Hommel:
    Stacking-Fault-Induced Pairs of Localizing Centers in ZnSe Quantum Wells.
    Journal of Crystal Growth 214/215, 634–638 (2000).
  • M. Evers, Th. Palberg, N. Dingenouts, M. Ballauff, H. Richter und Th. Schimmel:
    Vitrification in Restricted Geometry: Dry Films of Colloidal Particles.
    Progr. Coll. Polym. Sci. 115, 307–314 (2000).

1999

  • D. Siqueira Petri, S. Choi, H. Beyer, Th. Schimmel, M. Bruns, and G. Wenz:
    Synthesis of a Cellulose Thiosulfate and its Immobilization on Gold Surfaces.
    Polymer 40, 1593 (1999).
  • R. Wittmann, S. Spindler, B. Fischer, H. Wagner, D. Gerthsen, J. Lange, M. Brede, J. Klöwer, P. Schunk, and Th. Schimmel:
    Transmission Electron Microscopic Investigation of the Microstructure of Fe-Cr-Al Alloys:
    Journal of Materials Science, 34, 1791 (1999).
  • T. Walter, A. Rosenauer, R. Wittmann, D. Gerthsen, F. Fischer, T. Gerhard, A. Waag, G. Landwehr, P. Schunk, and Th. Schimmel:
    Structural Properties of BeTe/ZnSe Superlattices.
    Phys. Rev. B 59(12), 8114 (1999).
  • Th. Schimmel, P. von Blanckenhagen, and W. Schommers:
    Nanometer-Scale Structuring by Application of Scanning Probe Microscopes and Self-Organisation Processes.
    Appl. Phys. A 68, 263ff (1999).
  • A. Belenchuk, O. Shapoval, V. Kantser, A. Fedorov, P. Schunk, Th. Schimmel, and Z. Dashevsky:
    Growth of (111)-oriented PbTe Thin Films on Vicinal Si(111) and on Si(100) Using Fluoride Buffers.
    J. Cryst. Growth 198/199, 1216 (1999).
  • S. Molitor, P. Güthner, M. Müller, and Th. Schimmel:
    Scanning Force Microscopy on Au(111) in UHV Giant Atomic Corrugations on a Metal Surface.
    Appl. Phys. A 68, 263ff (1999).
  • Th. Schimmel, Th. Koch, J. Küppers, and M. Lux-Steiner:
    True Atomic Resolution under Ambient Conditions Obtained by Atomic Force Microscopy in the Contact Mode.
    Appl. Phys. A 68, 399 (1999).
  • H. Beyer, M. Müller, and Th. Schimmel:
    Monolayers of Graphite Rotated by a Defined Angle: Hexagonal Superstructures by STM.
    Appl. Phys. A 68, 163 (1999).
  • Ch. Adelmann, J. Hetzler, G. Scheiber, Th. Schimmel, M. Wegener, H. Weber, and H. von Löhneysen:
    Experiments on the Depolarisation Near-Field Scanning Optical Microscopy.
    Appl. Phys. Lett. 74, 179 (1999).
  • D. Siqueira Petri, G. Wenz, P. Schunk, Th. Schimmel, M. Bruns, and M.A. Dichtl:
    Surface Modification of Thin Polystyrene Films.
    Colloid & Polym. Sci. 277, 673–679 (1999).
  • D.F. Siqueira-Petri, G. Wenz, P. Schunk, and Th. Schimmel:
    An Improved Method for the Assembly of Amino-Terminated Monolayers on SiO2 and the Vapor Deposition of Gold Layers.
    Langmuir 15, 4520 (1999).
  • G. von Freymann, M. Wegener, and Th. Schimmel:
    Depolarization Nearfield Scanning Optical Microscopy: Influence of Wavelength and Tip-Shape on the Lateral Resolution.
    Surface and Interface Analysis (SIA) 27, 499 (1999).
  • G. von Freymann, Ch. Adelmann, G. Scheiber, Th. Schimmel, and M. Wegener:
    The Depolarization NSOM: Comparison of Experiment and Theory.
    J. Microscopy 194, 491 (1999).
  • D. Lüerßen, R. Bleher, H. Richter, Th. Schimmel, H. Kalt, A. Rosenauer, D. Litvinov, A. Kamilli, D. Gerthsen, K. Ohkawa, B. Jobst, and D. Hommel:
    Radiative Recombination Centers Induced by Stacking-Fault Pairs in ZnSe/ZnMgSSe Quantum Well Structures.
    Appl. Phys. Lett. 75, 3944 (1999).
  • Th. Schimmel:
    Rastersondenmikroskope als Werkzeuge und Messsonden für die Nanometer-Skala.
    Nachrichten Forschungszentrum Karlsruhe 32, 217–23 (1999).

1998

  • V. Popp, R. Kladny, Th. Schimmel, and J. Küppers:
    Structuring of Mica Surfaces with a Vibrating AFM
    Tip.
    Surf. Sci. 401, 105 (1998).
  • G. von Freymann, Th. Schimmel, M. Wegener, B. Hanewinkel, A. Knorr, and S.W. Koch:
    Computer Simulations by NSOM: Can Subwavelength Resolution be ObtainedUsing Uncoated Optical Fibre Probes?.
    Appl. Phys. Lett. 73(9), 1170 (1998).
  • D. Siqueira Petri, G. Wenz, P. Schunk, and Th. Schimmel:
    Amino-terminated self-assembled monolayers on SiO2 and their interaction chromophors, proteins and ionomers.
    Proc. 216th Meeting of the American Chemical Society, Boston, (1998).
  • G. Wenz, F. Siqueira Petri, S.W. Choi, H. Beyer, Th. Schimmel, and M. Bruns:
    Formation of Monolayers of Cellulose Thiosulfates on Gold and Silver Surfaces.
    Proc. 216th Meeting of the American Chemical Society, Boston, (1998).
  • R. Friedrich, Th. Galla, A. Naert, J. Peinke, and Th. Schimmel:
    Disordered Structures Analysed by the Theory of Markov Processes.
    J. Parisi, S. Müller und W. Zimmermann, A Perspective Look at Non-Linear Media, Seiten 313–326, Springer Verlag, Berlin/New York, (1998).
  • G. von Freymann, Th. Schimmel, and M. Wegener:
    Parallel Computing on Nearfield Scanning Optical Microscopy.
    High Performance Computing in Science and Engineering '98, E. Krause und W. Jäger (Hrsg.), Springer Verlag, Berlin, (1998).
  • G. von Freymann, Th. Schimmel, and M. Wegener:
    Computer Simulations: Subwavelength Resolution with an Apertureless SNOM.
    Appl. Phys. A, 66, (1998) S939.
  • M. Grün, F. Funfrock, P. Schunk, Th. Schimmel, M. Hetterich, and C. Klingshirn:
    On the Nature of Nanometer-Scale Islands Formed by Cadmium Selenide Deposition on Hexagonal Cadmium Sulfide (0001)A.
    Appl. Phys. Lett. 73(10), 1343 (1998).

1997

  • U. von Toussaint, Th. Schimmel, and J. Küppers:
    Computer Simulation of the AFM/LFM Imaging Process: Hexagonal versus Honeycomb Structure on Graphite.
    Surface and Interface Analysis 25, 620 (1997).

1996

  • Th. Schimmel, S. Böhringer, and J. Küppers:
    Nano-Characterisation and Material Contrast on Heterogeneous Samples by Scanning Force Techniques.
    Proc. XIth International Congress of the European Societies for Electron Microscopy, EUREM´96.

1995

  • Th. Schimmel, R. Kemnitzer, J. Küppers, H. Fuchs, and M. Lux-Steiner:
    Writing and Deleting Atomic-Scale Structures with the STM.
    Thin Solid Films 254, 147 (1995).
  • Th. Schimmel, R. Kemnitzer, J. Küppers, Ch. Kloc, and M. Lux-Steiner:
    Nanometer Scale Machining of Covalent Monolayers Investigated by Combined AFM/LFM.

    H.-J. Güntherodt, D. Anselmetti und E. Meyer (Hrsg.), Forces in Scanning Probe Methods, NATO ASI-Series, Kluwer, Dordrecht, S. 519–524, (1995).
  • Th. Schimmel, R. Kemnitzer, J. Küppers, Ch. Kloc, and M. Lux-Steiner:
    Giant Atomic Corrugations on Layered Dichalcogenides Investigated by AFM/LFM.
    H.-J. Güntherodt, D. Anselmetti und E. Meyer (Hrsg.), Forces in Scanning Probe Methods, NATO ASI-Series, Kluwer, Dordrecht, S. 513–518, (1995).
  • Th. Schimmel, K. Friemelt, J. Küppers, and M. Lux-Steiner:
    Atomic-Resolution Imaging of ReS2 by AFM/LFM.
    H.-J. Güntherodt, D. Anselmetti und E. Meyer (Hrsg.), Forces in Scanning Probe Methods, NATO ASI-Series, Kluwer, Dordrecht, S. 525–530, (1995).
  • Th. Schimmel, B. Winzer, J. Küppers, and M. Schwoerer:
    Investigating Monomer and Polymer Crystals of the Diacetylene TS-6 by Atomic Force Microscopy.

    "Procedures in Scanning Probe Microscopies", Wiley, Bern, (1995).
  • Th. Schimmel, H. Fuchs, and M. Lux-Steiner:
    Generating Atomic-Scale Replica of the STM Tip Apex with Preserved Atomic Order.
    "Procedures in Scanning Probe Microscopies", Wiley, Bern, (1995).
  • Th. Schimmel, J. Küppers, and M. Lux-Steiner:
    Atomic Resolution Imaging of the Layered Dichalcogenide WSe2 by AFM and LFM.
    "Procedures in Scanning Probe Microscopies", Wiley, Bern, (1995).
  • Th. Schimmel, K. Friemelt, M. Lux-Steiner, and E. Bucher:
    Combined Atomic Force-, Friction Force- and Local Elasticity Microscopy on ReS2 Crystals: Surface Topography and Material Contrast.
    Surface and Interface Analysis 23, (1995) 399.
  • Th. Schimmel, J. Küppers, and M. Lux-Steiner:
    Lattice Resolution AFM on the Layered Dichalcogenide WSe2 in the Sliding Regime.
    Thin Solid Films 264, 212 (1995).

1994

  • Th. Schimmel, and H. Fuchs:
    Löschbare Strukturen auf atomarer Skala.
    Phys. Bl. 50, 573 (1994).
  • Th. Schimmel, H.-G. Bingler, D. Franzke, and A. Wokaun:
    Scanning Force Microscopy on Silver Island Films: Correlation between Particle Geometry and Optical Properties.
    Adv. Mater. 6(4), 303 (1994).
  • Th. Schimmel, B. Winzer, R. Kemnitzer, Th. Koch, J. Küppers, and M. Schwoerer:
    Layer-by-Layer Growth and Decomposition of an Organic Crystal Observed in Real Time by Atomic Force Microscopy.
    Adv. Mater. 6(4), 307 (1994).

1993

  • G. Paasch, S. Karg, Th. Schimmel, W. Rieß, and M. Schwoerer:
    Comparison of Heterogeneous Polymer Models for the Explanation of Charge Transport in Naarmann-Polyacetylene,
    Synth. Metals 55–57, 4872 (1993).
  • Th. Schimmel, B. Winzer, J. Küppers and M. Schwoerer:
    Polymerization and Layer by Layer Growth of Diacetylene Single Crystals Investigated by Scanning Force Microscopy.
    Proc. of the Bayreuth Polymer and Research Symposium, Bayreuth, (1993).
  • H. Fuchs, Th. Schimmel, S. Akari, L.M. Eng, M. Anders M. Lux-Steiner, and K. Dransfeld:
    Layered Semiconductors as Materials for (Sub)Nanometer Scale Surface Modification with the STM.
    V.T. Binh et al. (eds.): Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications, S. 203–309, Kluwer, (1993).

1992

  • Th. Schimmel, H. Fuchs, R. Sander, and M. Lux-Steiner:
    Atomically resolved STM Imaging of Ion-bombarded WSe2.
    Ultramicroscopy 42–44, 683 (1992).
  • H. Fuchs, Th. Schimmel, M. Lux-Steiner, and E. Bucher:
    Investigating Atomic-scale Structures Generated with the STM.
    Ultramicroscopy 42–44, 1294 (1992).
  • Th. Schimmel, H. Fuchs, and M. Lux-Steiner:
    Generation and Manipulation of Atomic-scale Structures with the STM.

    phys. stat. sol. (a) 131, 47 (1992).
  • Th. Schimmel, H. Fuchs, K. Graf, and R. Sander:
    Annealing Behaviour of Ion-bombarded WSe2: A Combined LEED and STM Study.
    phys. stat. sol. (a) 131, 89 (1992).
  • Th. Schimmel, L. Eng, H. Fuchs, and M. Lux-Steiner:
    Mechanical Nanostructuring of WSe2 with the STM: Tip Shape Dependence and Writing Techniques.
    Annales de Chimie, 17, 205 (1992).
  • Th. Schimmel, M. Schwoerer, and H. Naarmann:
    Conductivity Barriers and Transmission Electron Microscopy on Highly Conducting Polyacetylene.
    H. Kuzmany, M. Mehring und S. Roth (Hrsg.), Springer Series in Solid State Sciences, Vol. 107, Electronic Properties of Polymers, Springer, Berlin-Heidelberg, S. 81 (1992).

1991

  • Th. Schimmel, D. Gläser, M. Schwoerer und H. Naarmann:
    Properties of Highly Conducting Polyacetylene.
    J.L. Brédas und R. Silbey (Hrsg.), Conjugated Polymers, Kluwer, Dordrecht, S. 49 (1991).
  • Th. Schimmel, H. Fuchs, S. Akari, and K. Dransfeld:
    Nanometer-Size Surface Modifications with Preserved Atomic Order Generated by Voltage Pulsing.
    Appl. Phys. Lett. 58, 1039 (1991).
  • H. Fuchs, and Th. Schimmel:
    Atomic Sites of a Bare Surface Modified with the Tunneling Microscope.
    Adv. Mater. 3, 112 (1991).
  • H. Fuchs, and Th. Schimmel:
    Time-stable Modifications of Bare Surfaces on an Atomic Scale.
    "Scanned Probe Microscopy", Hrsg. K. Wickramasinghe, American Institute of Physics, New York, S. 480–489 (1991).

Publikationen bis 1990

  • Th. Schimmel, M. Schwoerer, and H. Naarmann:
    Mechanisms Limiting the DC Conductivity of High-Conductivity Polyacetylene.
    Synth. Metals, 37, 1 (1990).
  • H. Fuchs, R. Laschinski, and Th. Schimmel:
    Atomic Resolution of Nanometer Scale Plastic Surface Deformations by Scanning Tunneling Microscopy.
    Europhys. Lett. 13(4), 307 (1990).
  • Th. Schimmel, G. Denninger, W. Rieß, J. Voit, M. Schwoerer, W. Schoepe, and H. Naarmann:
    High-Θ Polyacetylene: DC Conductivity between 14 mK and 300 K.
    Synth. Metals 28, D11 (1989).
  • D. Gläser, Th. Schimmel, M. Schwoerer, and H. Naarmann:
    On the Relationship between Room-Temperature Conductivity and Morphology of Polyacetylene.
    Makromol. Chem. 190, 3217 (1989).
  • Th. Schimmel, M. Schwoerer , and H. Naarmann:
    Mechanisms of Microscopic and Macroscopic Charge Transport in the Quasi-Onedimensional Organic Conductor (FA)2X.
    Synth. Metals 33, 311 (1989).
  • Th. Schimmel, W. Rieß, J. Gmeiner, G. Denninger, M. Schwoerer, H. Naarmann, and N. Theophilou:
    DC Conductivity on a New Type of Highly ConductingPolyacetylene, N-(CH)x,.
    Solid State Commun. 65, 1311 (1988).
  • Th. Schimmel, W. Rieß, G. Denninger, and M. Schwoerer:
    Precision Conductivity Measurements and DSC on Single Crystals of the Organic Conductor (FA)2PF6.
    Ber. Bunsenges. Phys. Chem. 91, 901 (1987).