Model: Bruker D8 Discover Thin Film XRD
Contact Person: Ralf Witte
The thin film XRD uses an X-ray tube generating Cu-radiation and it is equipped with an Eulerian-cradle and a xyz stage for sample mount. It can be used in two different setups.
o High Resolution X-Ray Diffraction (HRXRD): The primary optics feature a Goebel Mirror for abeam parallelization, followed by a four step automatic beam absorber and a 4-bounce Ge(022) Monochromator. The secondary beam path is equipped with the Bruker Pathfinder optics, which allows changing between an antiscattering slit and a secondary monochromator for highest resolution. This setup is applied to study epitaxial thin films by X-ray diffraction and reciprocal space mappings as well as to perform X-ray reflectivity measurements.
o Gracing Incidence X-ray diffraction (GIXRD): The incident beam is shaped parallel by the Goebel mirror and hits the sample under a gracing angle. The diffracted beam is analyzed with a 0.3° Soller collimator. This setup can be used to study thin polycrystalline or amorphous films; the gracing angle geometry allows suppressing the contribution from the substrate.