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Electron Microscopy Development

TEM Examples

We are always trying to improve our electron microscopic characterization to develop additional benefits for materials characterization. In particular, we are aiming for

  • direct correlation of structure and properties
  • more quantitative characterization
  • higher reliability of the analysis
  • faster results

In addition to improving or skills and expertise, we are actively developing new techniques

  • in situ TEM
  • in situ SEM
  • automated crystal orientation mapping
  • radial distribution function mapping
  • electron tomography