Sample Preparation
Laser system for
- TEM lamella preparation
- Cross section preparation
- Micro machining (CAD)
JEOL Cross Section Polisher II: Large area argon ion beam cross-section and plane view preparation.
ATM cutting machine
Sommer GS-1000 wire saw
WELL-3032 horizontal wire saw
WELL-3241 vertical wire saw
Allied MultiPrep for parallel and angle polishing
Struers RotoPol-25 polisher
Tegramin 25 polisher
Buehler VibroMet-2
Buehler MiniMet-1000
Cressington 328 high-vacuum carbon/metal coater
Cressington 108 Carbon Coater
Cressington 108 Gold Coater
Fischione 1040 NanoMill: Low-voltage argon ion polishing system for site selective thinning of TEM sample
Gatan PIPS II
Gatan PIPS with low-voltage argon ion polishing system and optional cryo cooling
Gatan Ultrasonic Cutter
Gatan 656 dimple grinder
Gatan 623 disc grinder
Struers TenuPol-5
Leica EM UC7 Ultramicrotome for Preparation of flat surface and ultrathin slices of polymers and composites using various diamond knifes.
Fischione 1070 Plasma Cleaner: Ar, Ar/O2 and Ar/H2 plasma cleaner for removal of organic contaminants.
Fischione 1020 Plasma Cleaner: Ar and Ar/O2 plasma cleaner for removal of organic contaminants.
Glovebox MBraun MB10
Glovebox GS Megaline 2
Flowbox to reduce dust during sample handling
Micromanipulator system inside glove box to enable remote controlled TEM sample handling and loading.
Struers LaboPress-1 infiltration system