Institute of Nanotechnology

Imaging and Diffraction

The INT hosts top level instruments in the field of electron microscopy and X-ray diffraction. The newly installed Thermofisher Themis-Z (double corrected) and Themis 300 (probe corrected)  transmission electron microscopes (TEM) and the Zeiss scanning electron microscopes (SEM) belong to the instruments which benefit nearly all groups at the INT.  Atomic force microscopes (AFM) allow the imaging and structuring of surfaces. With our scanning tunneling microscope (STM) working at cryogenic temperatures we can image the electronic structure of isolated molecules adsorbed on metallic surfaces. 

We feature a STOE single-crystal X-ray diffractometer with high luminosity Gallium-Jet x-ray source equipped with a Pilatus Dectris X-ray detector, which allows the determination of structures of very small crystallites. Our powder diffractometers by Bruker, STOE and Philips are the main work horse of our materials science groups working e.g. on battery research.   

 

Themis-Z and Themis 300 Transmission Electron Microscopes

Di Wang

Christian Kübel

FEI and Zeiss Focused Ion Beam Microscopes

Torsten Scherer

Sabine Schlabach

Zeiss Ultra plus Scanning Electron Microscopes

Simone Dehm

Ralph Krupke

4K UHV Scanning Tunneling Microscope

Lukas Gerhard

Bruker ICON Atomic Force Microscopes

Stefan Walheim

Trapped Ion Electron Diffraction Installation

Detlef Schooss

STOE Single Crystal X-ray diffractometer with Dectris Pilatus detector

Andreas Eichhöfer  

Olaf Fuhr

Bruker, Philips, and STOE X-Ray Powder Diffractometers

Andreas Eichhöfer

Olaf Fuhr

Ben Breitung