Imaging and Diffraction
The INT hosts top level instruments in the field of electron microscopy and X-ray diffraction. The newly installed Thermofisher Themis-Z (double corrected) and Themis 300 (probe corrected) transmission electron microscopes (TEM) and the Zeiss scanning electron microscopes (SEM) belong to the instruments which benefit nearly all groups at the INT. Atomic force microscopes (AFM) allow the imaging and structuring of surfaces. With our scanning tunneling microscope (STM) working at cryogenic temperatures we can image the electronic structure of isolated molecules adsorbed on metallic surfaces.
Feel free to enjoy a virtual tour through the lab with the recently installed Themis Z Transmission Electron Microscope (TEM).
We feature a STOE single-crystal X-ray diffractometer with high luminosity Gallium-Jet x-ray source equipped with a Pilatus Dectris X-ray detector, which allows the determination of structures of very small crystallites. Our powder diffractometers by Bruker, STOE and Philips are the main work horse of our materials science groups working e.g. on battery research.
Feel free to enjoy a virtual tour through the single-crystal X-ray spectroscopy lab room.
Zeiss Ultra plus Scanning Electron Microscopes |
||
4K UHV Scanning Tunneling Microscope |
Lukas Gerhard | |
Bruker ICON Atomic Force Microscopes |
Stefan Walheim | |
Trapped Ion Electron Diffraction Installation |
Detlef Schooss | |
STOE Single Crystal X-ray diffractometer with Dectris Pilatus detector |
||
Bruker, Malvern, and STOE X-Ray Powder Diffractometers |