Transmission Electron Microscopes

Advanced analystical transmission electron microscopy combined with in-situ approaches

Transmission electron microscopy (TEM) enables characterization of powders and thin films (which can be prepared in a target preparation from bulk materials) by direct imaging with up to atomic resolution. The image information can be locally correlated with spectroscopic techniques (EELS/EFTEM and EDX) to provide semi-quantitative elemental composition/maps with atomic resolution. All of these techniques can also be performed in-situ, e.g. during heating, electrical biasing or straining to directly correlate structural changes and materials properties. For complex three-dimensional structures, electron tomography can be used to generate a 3D representation of the material with a spatial resolution of ~1 nm.

Themis-Z Di Wang, KIT

ThermoFisher Themis-Z

Double Corrected Analytical (S)TEM

Themis 300 FEI Company
Themis 300

ThermoFischer Themis 300

Probe Corrected (S)TEM

Tecnai F20 ST
Tecnai F20 ST

Philips Tecnai F20 ST

In-situ TEM Atmosphere Holder Protochips Inc.
TEM Sample Holders

In-situ TEM holders

Tomography holders

Standard holders