The ultimate aim of our research is to correlate synthesis and processing of materials with properties and device function through their atomic, nano and micro scale structure in order to provide a knowledge base for tailoring new materials.
We are using state-of-the-art imaging, specroscopy and diffraction based electron microscopy techniques, both in-situ and ex-situ, to understand a variety of materials and provide a link to simulations.
While state-of-the-art electron microscopy techniques are extremely powerful, some research problems require dedicated method development to answer challenging structural or functional questions.
We are focusing on three main methdology areas in repsonse to the needs of our collaborations partners, developing approaches for dedicated structural and functional analysis of materials at the atomic or nanoscale.
In-situ and operando TEM providing a direct link between structural evolution and materials properties or function and the ability to identify transient structures, which can not be observed ex-situ.
- Mechanical testing
- Gas environment
4D-STEM techniques have been shown to be extremely powerful opening the possibiliy of high-end structural characterization using ptychography, pair distribution function mapping or quantitative crystal orientation anlysis as well as functional characterization by quantitatively measuring magnetic or electric feld distributions.
- STEM-DPC and STEM-iDPC
We are developing electron tomography as an approach to quantify the 3D nano and micro structure. In collabroations, we are using this experimental 3D structure as basis for diffusion or flow simultions.
- STEM tomography
- EDX tomography
- FIB Slice & View
- Quantitative tomography analysis