INT | Research Group Kübel

Themis 300

Themis 300
Themis 300

Configuration

  • High Tension: 80, 200, 300 kV       

  • X-FEG    

  • Aberration corrected (STEM)

  • BF-/seg. DF-/HAADF-STEM detector

  • Super-X EDX detector

  • NanoMegas ASTAR system

 

Resolution

  300 kV 200 kV 80 kV
Point Resolution TEM [nm] 0.2 0.24  
Information Limit TEM [nm] 0.1 0.1  
Resolution STEM [nm] 0.08 0.1 0.14

 

Imaging and Analysis Techniques      

  • BF-TEM & HRTEM      

  • BF-/DF-/HAADF-STEM

  • 4D-STEM: DPC/iDPC/PDF & ACOM

  • EDX Analysis

  • (S)TEM & EDX tomography

  • Electron diffraction

  • Lorentz imaging

  • Low-dose techniques & cryo imaging