In situ Electron Microscopy

In situ and operando TEM techniques provide a direct link between structural evolution, materials properties and their function. This includes the ability to identify intermediate structures, which cannot be observed ex situ. We are using and optimizing the techniques, combining them in particular with various 4D-STEM and spectroscopic techniques to provide an as complete structural, chemical and functional characterization as possible, while considering effects due to the electron beam and the sample geometry.