In-situ and operando TEM provides a direct link between structural evolution and materials properties or function and the ability to identify transient structures, which cannot be observed ex-situ. We are using and optimizing the techniques, combining them in particular with various 4D-STEM and spectroscopic techniques.

4D-STEM techniques have been shown to be extremely powerful, opening the possibility of high-end structural characterization using ptychography, pair distribution function mapping or quantitative crystal orientation analysis as well as functional characterization by quantitatively measuring magnetic or electric field distributions.

We are developing electron tomography as an approach to quantify the 3D nano and micro structure. In collaborations, we are using this experimental 3D structure as basis for diffusion or flow simulations.

Correlative characterization workflows that integrate complementary imaging techniques such as FIB/SEM, light microscopy, X-ray CT, and TEM into a unified three-dimensional framework.

Assessing radiation damage is essential for reliable in-situ TEM analysis.

We develop improved handling and preparation methods—especially for air-sensitive and FIB-made samples—to keep TEM specimens as close as possible to their native state.