Microscopy Method Development
We are focusing on four main methodology areas in response to the needs of our collaborations partners, developing approaches for dedicated structural and functional analysis of materials at the atomic, nano- and microscale. A particular focus is on correlated or, ideally, simultaneous structural and functional characterization.
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In situ and operando TEM provides a direct link between structural evolution and materials properties or function and the ability to identify intermediate structures, which cannot be observed ex situ. We are using and optimizing the techniques, combining them with low-dose imaging and various 4D-STEM and spectroscopic techniques for meaningful in situ/operando investigations. Closely related, we are developing identical location FIB/SEM techniques as alternative approach to follow structural evolution using snapshots of the same region at defined states.
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4D-STEM techniques have been shown to be extremely powerful, opening the possibility to (simultaneously) perform high-end structural and functional characterization by combining pair distribution function, crystal orientation and strain mapping together with electric or magnetic field mapping at the nanoscale. In addition, ptychography techniques give access to unprecedented atomic level characterization.
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We are developing electron tomography as an approach to quantify the 3D nano and micro structure. In collaborations, we are using these experimental 3D structure as basis for diffusion or flow simulations.
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We are establishing correlative characterization workflows that integrate complementary scale bridging imaging techniques such as FIB/SEM, light microscopy, X-ray CT, and TEM into a unified three-dimensional characterization framework.
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