Correlative Characterization

Our research focuses on correlative characterization workflows that integrate complementary imaging techniques such as FIB/SEM, light microscopy, X-ray CT, and TEM into a unified three-dimensional framework.

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Dr. Scherer’s Group

Correlative 3D Workflow

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Figure 2- Our correlative workflow allows targeting and extracting a sub-surface region of interest (ROI, several µm) within a macroscopic sample (mm to cm), with an accuracy of 1-2 µm - essentially a needle-in-a-haystack problem. Global markers, local markers and ROI markers are used for tracking and registering the ROI in 3D.

Correlative Microscopy

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A central challenge in correlative microscopy is the accurate localization and revisiting of identical regions of interest across modalities with fundamentally different imaging geometries and contrasts.

To solve this problem, we developed a two-step alignment and ROI targeting concept based on global, local, and fine reference markers, supported by a dedicated sample carrier. This enables robust three-dimensional registration and micrometer-scale targeting accuracy, including for sub-surface and weak-contrast features. We apply these methods to address challenging materials science questions and collaborate with partners to implement them in diverse experimental environments.

Figure1- FIB tomography (Slice&View) on 30 x 30 x 30 µm² volume, showing an encapsulated particle in extruded steel, initially identified by X-ray Micro-CT. See the Focused Ion Beam page.