Identical Location SEM/FIB Characterization

Correlating microstructural features across length scales is essential for understanding grain refinement, phase transformations, and defect evolution in severely deformed materials. Identical-location SEM/FIB/TEM characterization tracks the exact same region throughout the workflow, providing unambiguous, site-specific insight into microstructural evolution, motivating its use wherever bulk or randomly-sampled characterization cannot resolve the underlying mechanisms.